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ECE Ph.D. Student Wins Best Paper Award at IEEE AUTOTESTCON

ECE Ph.D. Student Wins Best Paper Award at IEEE AUTOTESTCON

ECE Ph.D. student Seokjin Kim won the best student paper award at IEEE AUTOTESTCON, the world's only conference focused primarily on

automated test for integrated systems technology aimed at military, government and aerospace applications. The conference, hosted by the Institute of Electrical & Electronic Engineers (IEEE), was held in the Baltimore Inner Harbor from September 17-20, 2007.

Seokjin won the award for a paper he co-authored with his advisor, ECE Professor Martin Peckerar, and Radmil Elkis of Hughes Network Systems, titled "Device verification testing of high-speed analog-to-digital converters used in satellite communications systems."

For more information about IEEE AUTOTESTCON, visit: http://www.autotestcon.com/.

September 21, 2007


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