Ideas
Quick jump to this week. |
Columns: Work type, heading, goals, time if applicable.
| Literature | Things to read | New papers Bo found: Think about current flow & circuit model. Wong's paper: Patterned substrate. Weisshaar: Circuit model; C(w) explanation. Circuit model for inductor in general: Whence f-dependence of L? | Tuesday | |
| Modeling/writing | DD and Maxwell equations | Write out DD-eqns, Maxwell eqns; determine confluence point | Thursday | |
| Simulation/Modeling | Make inductor code 3-D | Review code mechanics, include metal thickness. | Thursday | |
| Experiment | Session with Todd | Measurements taken with a DC bias on the inductors in the October chips | Thursday | ![]() |
| Data Analysis | Analyze data gathered w/ DC biasing | Plot out results of measurements taken with a DB bias on the inductors in the October chips | Thursday | ![]() |
| Report | Write short report about all inductance measurements to date | Measurements taken with or without bias on the inductors in the October chips; include effects of temperature, put in speculations about capacitance, point out trends in doping and frequency | Friday | ![]() |
| Administrative | Travel expense | Compile travel expense statement with receipts etc. | Friday | ![]() |
| Simulation/modeling | MOSCAP in 2d freq solver | Convert the 2-D frequency solver to a moscap-like geometry | Saturday | |
| Design | Deadline for C5N submission! | Send out new inductor chips---esp. patterned substrate, on pin junction, also different measurement setup (Y-parameters, as in the Power paper?). | Monday | ![]() |
| Education | ITHET Conference paper deadline! | Paper about 498c; expand the summary. | Wednesday the 16th. | ![]() |
| Theoretical | Drift-diffusion solver for pin junction | Examine how much we can change conductivity in a region under the inductor | Monday/Tuesday | |
| Meeting | Xi is here | Input? Inclusion of substrate? No ground plane? Need the substr. current estimate results before this. | Tuesday |
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| Simulation | Stacked inductor behaviour | First-order estimate of capacitance, first-order circuit model, see where the resonance would have occurred | Wednesday (in preparation for experiment) |
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| Theoretical | Calculate return current depth for our inductors | Using assumed process parameters and the methodology in the 1996 Weisshaar et al paper, look at where the return current for our inductors is likely to be. Investigate behaviour in our frequency range, might explain the amount (or lack thereof) of difference between the n-well, p-substrate and grounded poly. | Wednesday (in preparation for experiment) |
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| Presentational | Prepare figures of the simulation results for the inductors we have manifactured, reorganize results for presentation. | Shows expected variation in frequency range. | Wednesday |
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| Experimental | Inductance measurements | Test the other three untested copies of the inductor chip. Make sure we have consistently reproducible measurements for each copy. | Thursday afternoon. |
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| Data fitting | Inductance data processing | Organize and post-process data. | Thursday ev./Friday morning. |
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| Data fitting | Inductance data processing | Interpret results. Use Spectre simulation to curve-fit a basic inductor circuit model. | Thursday ev./Friday | |
| Theoretical | Derivation of the external self-inductance expression | Trace the origin of the equation we use in the inductor modeling program to justify its use. | Weekend | |
| Simulation | Survey of commercial EM simulation tools | What? Does what? Available where? | ||
| Theoretical | MOS capacitance analysis | See what DC-biasing inductor metal might do to the doping underneath for the n-well inductor | Weekend | |