- Charged particle optics
- Applications of field emission processes
Jon Orloff received a B.S. in physics from M.I.T. in 1964 and a Ph.D. in applied physics from the Oregon Graduate Institute in 1977. He worked for Elektros, Inc. 1970-1975 on a TEM project and was on the Faculty of the Oregon Graduate Institute, in the Department of Applied Physics and Electrical Engineering 1977-1993, where he developed high resolution focused ion beam (FIB) technology, and was on the board of directors of FEI Company, where he also did optics design. He has been a Professor at the University of Maryland (College Park) in the Department of Electrical and Computer Engineering since 1993. He has authored or co-authored more than 80 publications including "Handbook of Charged Particle Optics" (Boca Raton, FL, CRC Press, 1997) (as editor) and "High Resolution Focused Ion Beams" (New York, Kluwer/Academic Press, 2003) (with Utlaut and Swanson).
Professor Orloff was the Conference Chair of and is on the Advisory Committee of the Electron, Ion Photon Beam and Nanotechnology Conference. He is a Fellow of the I.E.E.E. and of the A.A.A.S.